Design for testability (DFT), a way to build testability into an integrated circuit (IC) at the design stage to lower testing costs and increase manufacturing yield, has been around for many years in ...

Of all the electronic design automation (EDA) tools on the market, design for test (DFT) may be the most under-appreciated; even though building testability into a chip during the design phase will ...

Combining these Apps with an emulation environment makes it possible to increase fault coverage, increase production yield, and reduce ATE test time and cost. The design-for-test (DFT) technology was ...